Surface Probe Microscopy - Sideversjonshistorikk

Fredrimu: /* Surface forces */

2009-05-24T10:34:37Z

Surface forces

← Eldre sideversjon		Sideversjonen fra 24. mai 2009 kl. 10:34
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	==Surface forces==		==Surface forces==
	Three ~~regions~~ can be ~~distinguished on the potential energy curve of to solid surfaces brought into contact~~.
	~~For larger distances, the non~~-contact ~~mode, where the~~ attractive forces ~~dominate. These are for example caused by the Coulombic electrostatic forces, if the surfaces are of differernt charge~~.		Three interaction zones:
	~~At distances~~ smaller than the distance at which the potential ~~enrgy~~ is zero~~, one can define the contact mode~~. ~~The repulsive~~ forces are ~~dominating and the attractive ones~~ negligible. These ~~are caused by~~ steric hindrance, ~~or the~~ Debye/diffuse double layers for example.		*Non-contact zone: Only long range forces are experienced. Usually attractive. Coulomb forces - strongest long range forces (can be repulsive as well).
	~~In between these two regions there is the semi-contact region~~.		*Semi-contact region: Similar magnitude of repulsive and attractive forces.
			*Contact zone: Distances smaller than the distance at which the potential energy is zero. Attractive forces are negligible. Short range repulsive forces dominate.

			The forces:
			* Strong long-range forces: Coulomb forces
			* Shorter distances: Van der Waals (kålloidal kemmistri!) These forces decay rapidly, with <math>f \propto d^{-7}</math>
			* Strong short range forces: Overlapping of electron shells (steric hindrance), Debye/diffuse double layers for example.

	==Resolution==		==Resolution==

Elisaari: /* Lenker */

2009-05-24T09:50:05Z

Lenker

← Eldre sideversjon		Sideversjonen fra 24. mai 2009 kl. 09:50
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	#[[STM]]		#[[STM]]
	#[[Field Ion Microscopy and Atom probe tomography]]		#[[Field Ion Microscopy and Atom probe tomography]]

			[[Kategori: Teknikker i tools]]

Elisaari: /* Lenker */

2009-05-24T09:39:57Z

Lenker

← Eldre sideversjon		Sideversjonen fra 24. mai 2009 kl. 09:39
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	#[[AFM]]		#[[AFM]]
	#[[STM]]		#[[STM]]
	#[[Field Ion Microscopy]]		#[[Field Ion Microscopy and Atom probe tomography]]
	~~#[[~~Atom probe tomography]]

Elisaari: /* Lenker */

2009-05-24T09:37:27Z

Lenker

← Eldre sideversjon		Sideversjonen fra 24. mai 2009 kl. 09:37
Linje 14:		Linje 14:
	#[[AFM]]		#[[AFM]]
	#[[STM]]		#[[STM]]
			#[[Field Ion Microscopy]]
			#[[Atom probe tomography]]

Elisaari på 23. mai 2009 kl. 17:04

2009-05-23T17:04:19Z

← Eldre sideversjon		Sideversjonen fra 23. mai 2009 kl. 17:04
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	~~En overkategori for AFM~~, ~~STM og andre overflateprobebaserte mikroskop~~.		Scaning probe microscopy is a field where microstructural information can be obtained by bringing a sharp, needle-shaped solid probe into close proximity to the surface we want to study. This method can give information about the surface structure and surface properties.

	==Surface forces==		==Surface forces==
Linje 14:		Linje 14:
	#[[AFM]]		#[[AFM]]
	#[[STM]]		#[[STM]]

	Scaning probe microscopy is a field where microstructural information can be obtained by bringing a sharp, needle-shaped solid probe into close proximity to the surface we want to study. This method can give information about the surface structure and surface properties.

Elisaari på 23. mai 2009 kl. 17:03

2009-05-23T17:03:33Z

@@ Linje 1: / Linje 1: @@
 En overkategori for AFM, STM og andre overflateprobebaserte mikroskop.
 ==Surface forces==
@@ Linje 17: / Linje 10: @@
 The probe tip radius limits the resolution of the image and it will be at least one order of magnitude bigger than the atom spacings.
 But it can still give atomic resolution.

Elisaari: /* Lenker */

2009-05-23T17:02:47Z

Lenker

← Eldre sideversjon		Sideversjonen fra 23. mai 2009 kl. 17:02
Linje 5:		Linje 5:
	#[[AFM]]		#[[AFM]]
	#[[STM]]		#[[STM]]

			Scaning probe microscopy is a field where microstructural information can be obtained by bringing a sharp, needle-shaped solid probe into close proximity to the surface we want to study. This method can give information about the surface structure and surface properties.

			==Surface forces==
			Three regions can be distinguished on the potential energy curve of to solid surfaces brought into contact.
			For larger distances, the non-contact mode, where the attractive forces dominate. These are for example caused by the Coulombic electrostatic forces, if the surfaces are of differernt charge.
			At distances smaller than the distance at which the potential enrgy is zero, one can define the contact mode. The repulsive forces are dominating and the attractive ones negligible. These are caused by steric hindrance, or the Debye/diffuse double layers for example.
			In between these two regions there is the semi-contact region.

			==Resolution==
			The probe tip radius limits the resolution of the image and it will be at least one order of magnitude bigger than the atom spacings.
			But it can still give atomic resolution.

Mariusuv: Ny side: En overkategori for AFM, STM og andre overflateprobebaserte mikroskop. == Lenker == #AFM #STM

2008-10-26T15:49:42Z

Ny side: En overkategori for AFM, STM og andre overflateprobebaserte mikroskop. == Lenker == #AFM #STM

Ny side

En overkategori for AFM, STM og andre overflateprobebaserte mikroskop.

== Lenker ==
#[[AFM]]
#[[STM]]