Vis kilden til Surface Probe Microscopy

Scaning probe microscopy is a field where microstructural information can be obtained by bringing a sharp, needle-shaped solid probe into close proximity to the surface we want to study. This method can give information about the surface structure and surface properties.

==Surface forces==

Three interaction zones:
*Non-contact zone: Only long range forces are experienced. Usually attractive. Coulomb forces - strongest long range forces (can be repulsive as well).
*Semi-contact region: Similar magnitude of repulsive and attractive forces.
*Contact zone: Distances smaller than the distance at which the potential energy is zero. Attractive forces are negligible. Short range repulsive forces dominate.

The forces:
* Strong long-range forces: Coulomb forces
* Shorter distances: Van der Waals (kålloidal kemmistri!) These forces decay rapidly, with <math>f \propto d^{-7}</math>
* Strong short range forces: Overlapping of electron shells (steric hindrance), Debye/diffuse double layers for example.

==Resolution==
The probe tip radius limits the resolution of the image and it will be at least one order of magnitude bigger than the atom spacings.
But it can still give atomic resolution.

== Lenker ==
#[[AFM]]
#[[STM]]
#[[Field Ion Microscopy and Atom probe tomography]]

[[Kategori: Teknikker i tools]]