NanoWiki - Brukerbidrag [nb]

Diffraction

2009-05-24T14:34:11Z

Elisaari:

==Short facts==

*Elastic scattering (no energy loss).
*The wavelength of the radiation should be comparable to the interatomic spacing of the material.

==Background==
Crystalline, polycrystalline and amorphous materials.

The crystal lattice: unit cell and point lattices. The seven crystal systems. Space groups. Miller indices and Unit vectors. Reciprocal space.

===Bragg's law===
*Condition: The planes of atoms responsible for a diffraction peak have to behave as a specula mirror, so that the angle of incidence <math>\theta</math> equals the angle of reflection.
*Bragg's law
:<math> n\lambda=2dsin\theta </math>
where n is an integer, <math>\lambda</math> is the wavelength of the radiation, d is the spacing of the crystal lattice planes and <math>\theta</math> is is the reflection angle.

*Allowed and forbidden reflections
In the FCC (face-centered cubic) lattice the Miller indices have to be all odd or all even.

In the BCC (body-centeres cubic) lattice the sum of h+k+l must be odd for an allowed reflection.

===Reciprocal space===
Bragg's law imposes that the angles of diffraction are inversely proportional to the spacing of the lattice planes. It is therefore helpful to introduce a coordinate system where the axes have the dimensions of inverse length (nm^-1). This system of coordinates is referred to as the reciprocal space.
*The limiting sphere and the Ewald's sphere:

'''The limiting sphere:''' The values of sin<math>\theta</math> will lie between -1 and 1 and therfore 1/d has to lie between 0 and <math>2/\lambda</math> for a diffraction pattern to be generated. (Bragg's law has to be fulfilled). A sphere of radius 2/<math>\lambda</math> is then drawn, where the diffraction crystal is located at the center of the sphere. This sphere, containing all the possible values of 1/d for a given <math>\lambda</math> is called the limiting sphere.

'''The Ewald's sphere:''' A smaller sphere of radius 1/<math>\lambda</math> (1/2 of the limiting sphere), that lies in the limiting spere, which is placed so that it just touches the limiting sphere and also the the position of the crystal (the center). This is the Ewals's sphere, or reflecting sphere.
*The reciprocal lattice

==X-ray diffraction==
===Set-up===
The X-ray diffractometer is composed of: a X-ray generator, a diffractometer assembly (controls the alignment of the beam as well as the position and orientation of the specimen and the X-ray detector), a detector assembly, X-ray data collection and processing systems.
*Generation of X-rays: X-rays are generated by acceleration of electrons on a pure metal target in ultra-high vacuum. Så må jeg si jeg ikke helt skjønner hva som skjer: hvilke elektroner dytter vekk hvilke? ++
*Characteristic radiation

===Aberrations===
Caused by:
*Variations in X-ray wavelength (non-monochromatic)
*Variations in the angle of the incident beam with respect to the crystal (the rays of the beams are not strictly parallel).
===Powder diffraction===
Polycrystalline samples. The individual grains (single crystals) are randomly orientated in all directions)

===Single crystal diffraction===

===Diffraction analysis===

==Electron Diffraction==

[[Kategori: Teknikker i tools]]

Diffraction

2009-05-24T14:24:12Z

Elisaari: /* X-ray diffraction */

Diffraction

2009-05-24T14:10:38Z

Elisaari: /* X-ray diffraction */

==Short facts==

*Elastic scattering (no energy loss).
*The wavelength of the radiation should be comparable to the interatomic spacing of the material.

==Background==
Crystalline, polycrystalline and amorphous materials.

The crystal lattice: unit cell and point lattices. The seven crystal systems. Space groups. Miller indices and Unit vectors. Reciprocal space.

===Bragg's law===
*Condition: The planes of atoms responsible for a diffraction peak have to behave as a specula mirror, so that the angle of incidence <math>\theta</math> equals the angle of reflection.
*Bragg's law
:<math> n\lambda=2dsin\theta </math>
where n is an integer, <math>\lambda</math> is the wavelength of the radiation, d is the spacing of the crystal lattice planes and <math>\theta</math> is is the reflection angle.

*Allowed and forbidden reflections
In the FCC (face-centered cubic) lattice the Miller indices have to be all odd or all even.

In the BCC (body-centeres cubic) lattice the sum of h+k+l must be odd for an allowed reflection.

===Reciprocal space===
Bragg's law imposes that the angles of diffraction are inversely proportional to the spacing of the lattice planes. It is therefore helpful to introduce a coordinate system where the axes have the dimensions of inverse length (nm^-1). This system of coordinates is referred to as the reciprocal space.
*The limiting sphere and the Ewald's sphere:

'''The limiting sphere:''' The values of sin<math>\theta</math> will lie between -1 and 1 and therfore 1/d has to lie between 0 and <math>2/\lambda</math> for a diffraction pattern to be generated. (Bragg's law has to be fulfilled). A sphere of radius 2/<math>\lambda</math> is then drawn, where the diffraction crystal is located at the center of the sphere. This sphere, containing all the possible values of 1/d for a given <math>\lambda</math> is called the limiting sphere.

'''The Ewald's sphere:''' A smaller sphere of radius 1/<math>\lambda</math> (1/2 of the limiting sphere), that lies in the limiting spere, which is placed so that it just touches the limiting sphere and also the the position of the crystal (the center). This is the Ewals's sphere, or reflecting sphere.
*The reciprocal lattice

==X-ray diffraction==
===Set-up===
The X-ray diffractometer is composed of: a X-ray generator, a diffractometer assembly (controls the alignment of the beam as well as the position and orientation of the specimen and the X-ray detector), a detector assembly, X-ray data collection and processing systems.
*Generation of X-rays: X-rays are generated by acceleration of electrons on a pure metal target in ultra-high vacuum. Så må jeg si jeg ikke helt skjønner hva som skjer: hvilke elektroner dytter vekk hvilke? ++
*Characteristic radiation
===Powder diffraction===
Polycrystalline samples. The individual grains (single crystals) are randomly orientated in all directions)

===Single crystal diffraction===

===Diffraction analysis===
[[Kategori: Teknikker i tools]]

Diffraction

2009-05-24T14:09:55Z

Elisaari: /* Reciprocal space */

==Short facts==

*Elastic scattering (no energy loss).
*The wavelength of the radiation should be comparable to the interatomic spacing of the material.

==Background==
Crystalline, polycrystalline and amorphous materials.

The crystal lattice: unit cell and point lattices. The seven crystal systems. Space groups. Miller indices and Unit vectors. Reciprocal space.

===Bragg's law===
*Condition: The planes of atoms responsible for a diffraction peak have to behave as a specula mirror, so that the angle of incidence <math>\theta</math> equals the angle of reflection.
*Bragg's law
:<math> n\lambda=2dsin\theta </math>
where n is an integer, <math>\lambda</math> is the wavelength of the radiation, d is the spacing of the crystal lattice planes and <math>\theta</math> is is the reflection angle.

*Allowed and forbidden reflections
In the FCC (face-centered cubic) lattice the Miller indices have to be all odd or all even.

In the BCC (body-centeres cubic) lattice the sum of h+k+l must be odd for an allowed reflection.

===Reciprocal space===
Bragg's law imposes that the angles of diffraction are inversely proportional to the spacing of the lattice planes. It is therefore helpful to introduce a coordinate system where the axes have the dimensions of inverse length (nm^-1). This system of coordinates is referred to as the reciprocal space.
*The limiting sphere and the Ewald's sphere:

'''The limiting sphere:''' The values of sin<math>\theta</math> will lie between -1 and 1 and therfore 1/d has to lie between 0 and <math>2/\lambda</math> for a diffraction pattern to be generated. (Bragg's law has to be fulfilled). A sphere of radius 2/<math>\lambda</math> is then drawn, where the diffraction crystal is located at the center of the sphere. This sphere, containing all the possible values of 1/d for a given <math>\lambda</math> is called the limiting sphere.

'''The Ewald's sphere:''' A smaller sphere of radius 1/<math>\lambda</math> (1/2 of the limiting sphere), that lies in the limiting spere, which is placed so that it just touches the limiting sphere and also the the position of the crystal (the center). This is the Ewals's sphere, or reflecting sphere.
*The reciprocal lattice

==X-ray diffraction==
The X-ray diffractometer is composed of: a X-ray generator, a diffractometer assembly (controls the alignment of the beam as well as the position and orientation of the specimen and the X-ray detector), a detector assembly, X-ray data collection and processing systems.
*Generation of X-rays: X-rays are generated by acceleration of electrons on a pure metal target in ultra-high vacuum. Så må jeg si jeg ikke helt skjønner hva som skjer: hvilke elektroner dytter vekk hvilke? ++
*Characteristic radiation
===Powder diffraction===
Polycrystalline samples. The individual grains (single crystals) are randomly orientated in all directions)

===Single crystal diffraction===

===Diffraction analysis===
[[Kategori: Teknikker i tools]]

Diffraction

2009-05-24T14:08:38Z

Elisaari:

==Short facts==

*Elastic scattering (no energy loss).
*The wavelength of the radiation should be comparable to the interatomic spacing of the material.

==Background==
Crystalline, polycrystalline and amorphous materials.

The crystal lattice: unit cell and point lattices. The seven crystal systems. Space groups. Miller indices and Unit vectors. Reciprocal space.

===Bragg's law===
*Condition: The planes of atoms responsible for a diffraction peak have to behave as a specula mirror, so that the angle of incidence <math>\theta</math> equals the angle of reflection.
*Bragg's law
:<math> n\lambda=2dsin\theta </math>
where n is an integer, <math>\lambda</math> is the wavelength of the radiation, d is the spacing of the crystal lattice planes and <math>\theta</math> is is the reflection angle.

*Allowed and forbidden reflections
In the FCC (face-centered cubic) lattice the Miller indices have to be all odd or all even.

In the BCC (body-centeres cubic) lattice the sum of h+k+l must be odd for an allowed reflection.

===Reciprocal space===
Bragg's law imposes that the angles of diffraction are inversely proportional to the spacing of the lattice planes. It is therefore helpful to introduce a coordinate system where the axes have the dimensions of inverse length (nm^-1). This system of coordinates is referred to as the reciprocal space.
*The limiting sphere and the Ewald's sphere:

The limiting sphere: The values of sin<math>\theta</math> will lie between -1 and 1 and therfore 1/d has to lie between 0 and <math>2/\lambda</math> for a diffraction pattern to be generated. (Bragg's law has to be fulfilled). A sphere of radius 2/<math>\lambda</math> is then drawn, where the diffraction crystal is located at the center of the sphere. This sphere, containing all the possible values of 1/d for a given <math>\lambda</math> is called the limiting sphere.

The Ewald's sphere: A smaller sphere of radius 1/<math>\lambda</math> (1/2 of the limiting sphere), that lies in the limiting spere, which is placed so that it just touches the limiting sphere and also the the position of the crystal (the center). This is the Ewals's sphere, or reflecting sphere.
*The reciprocal lattice

==X-ray diffraction==
The X-ray diffractometer is composed of: a X-ray generator, a diffractometer assembly (controls the alignment of the beam as well as the position and orientation of the specimen and the X-ray detector), a detector assembly, X-ray data collection and processing systems.
*Generation of X-rays: X-rays are generated by acceleration of electrons on a pure metal target in ultra-high vacuum. Så må jeg si jeg ikke helt skjønner hva som skjer: hvilke elektroner dytter vekk hvilke? ++
*Characteristic radiation
===Powder diffraction===
Polycrystalline samples. The individual grains (single crystals) are randomly orientated in all directions)

===Single crystal diffraction===

===Diffraction analysis===
[[Kategori: Teknikker i tools]]

Diffraction

2009-05-24T14:07:37Z

Elisaari: /* X-ray diffraction */

==Background==
Crystalline, polycrystalline and amorphous materials.

The crystal lattice: unit cell and point lattices. The seven crystal systems. Space groups. Miller indices and Unit vectors. Reciprocal space.

==Short facts==

*Elastic scattering (no energy loss).
*The wavelength of the radiation should be comparable to the interatomic spacing of the material.

==Bragg's law==
*Condition: The planes of atoms responsible for a diffraction peak have to behave as a specula mirror, so that the angle of incidence <math>\theta</math> equals the angle of reflection.
*Bragg's law
:<math> n\lambda=2dsin\theta </math>
where n is an integer, <math>\lambda</math> is the wavelength of the radiation, d is the spacing of the crystal lattice planes and <math>\theta</math> is is the reflection angle.

*Allowed and forbidden reflections
In the FCC (face-centered cubic) lattice the Miller indices have to be all odd or all even.

In the BCC (body-centeres cubic) lattice the sum of h+k+l must be odd for an allowed reflection.

==Reciprocal space==
Bragg's law imposes that the angles of diffraction are inversely proportional to the spacing of the lattice planes. It is therefore helpful to introduce a coordinate system where the axes have the dimensions of inverse length (nm^-1). This system of coordinates is referred to as the reciprocal space.
*The limiting sphere and the Ewald's sphere:

The limiting sphere: The values of sin<math>\theta</math> will lie between -1 and 1 and therfore 1/d has to lie between 0 and <math>2/\lambda</math> for a diffraction pattern to be generated. (Bragg's law has to be fulfilled). A sphere of radius 2/<math>\lambda</math> is then drawn, where the diffraction crystal is located at the center of the sphere. This sphere, containing all the possible values of 1/d for a given <math>\lambda</math> is called the limiting sphere.

The Ewald's sphere: A smaller sphere of radius 1/<math>\lambda</math> (1/2 of the limiting sphere), that lies in the limiting spere, which is placed so that it just touches the limiting sphere and also the the position of the crystal (the center). This is the Ewals's sphere, or reflecting sphere.
*The reciprocal lattice

==X-ray diffraction==
The X-ray diffractometer is composed of: a X-ray generator, a diffractometer assembly (controls the alignment of the beam as well as the position and orientation of the specimen and the X-ray detector), a detector assembly, X-ray data collection and processing systems.
*Generation of X-rays: X-rays are generated by acceleration of electrons on a pure metal target in ultra-high vacuum. Så må jeg si jeg ikke helt skjønner hva som skjer: hvilke elektroner dytter vekk hvilke? ++
*Characteristic radiation
===Powder diffraction===
Polycrystalline samples. The individual grains (single crystals) are randomly orientated in all directions)

===Single crystal diffraction===

===Diffraction analysis===
[[Kategori: Teknikker i tools]]

Diffraction

2009-05-24T13:57:03Z

Elisaari: /* Reciprocal space */

==Background==
Crystalline, polycrystalline and amorphous materials.

The crystal lattice: unit cell and point lattices. The seven crystal systems. Space groups. Miller indices and Unit vectors. Reciprocal space.

==Short facts==

*Elastic scattering (no energy loss).
*The wavelength of the radiation should be comparable to the interatomic spacing of the material.

==Bragg's law==
*Condition: The planes of atoms responsible for a diffraction peak have to behave as a specula mirror, so that the angle of incidence <math>\theta</math> equals the angle of reflection.
*Bragg's law
:<math> n\lambda=2dsin\theta </math>
where n is an integer, <math>\lambda</math> is the wavelength of the radiation, d is the spacing of the crystal lattice planes and <math>\theta</math> is is the reflection angle.

*Allowed and forbidden reflections
In the FCC (face-centered cubic) lattice the Miller indices have to be all odd or all even.

In the BCC (body-centeres cubic) lattice the sum of h+k+l must be odd for an allowed reflection.

==Reciprocal space==
Bragg's law imposes that the angles of diffraction are inversely proportional to the spacing of the lattice planes. It is therefore helpful to introduce a coordinate system where the axes have the dimensions of inverse length (nm^-1). This system of coordinates is referred to as the reciprocal space.
*The limiting sphere and the Ewald's sphere:

The limiting sphere: The values of sin<math>\theta</math> will lie between -1 and 1 and therfore 1/d has to lie between 0 and <math>2/\lambda</math> for a diffraction pattern to be generated. (Bragg's law has to be fulfilled). A sphere of radius 2/<math>\lambda</math> is then drawn, where the diffraction crystal is located at the center of the sphere. This sphere, containing all the possible values of 1/d for a given <math>\lambda</math> is called the limiting sphere.

The Ewald's sphere: A smaller sphere of radius 1/<math>\lambda</math> (1/2 of the limiting sphere), that lies in the limiting spere, which is placed so that it just touches the limiting sphere and also the the position of the crystal (the center). This is the Ewals's sphere, or reflecting sphere.
*The reciprocal lattice

==X-ray diffraction==
The X-ray diffractometer is composed of: a X-ray generator, a diffractometer assembly (controls the alignment of the beam as well as the position and orientation of the specimen and the X-ray detector), a detector assembly, X-ray data collection and processing systems.
*Generation of X-rays: X-rays are generated by acceleration of electrons on a pure metal target in ultra-high vacuum. Så må jeg si jeg ikke helt skjønner hva som skjer: hvilke elektroner dytter vekk hvilke? ++
*Characteristic radiation
*Powder diffraction: Polycrystalline samples. The individual grains (single crystals) are randomly orientated in all directions)

[[Kategori: Teknikker i tools]]

Diffraction

2009-05-24T13:56:35Z

Elisaari: /* Reciprocal space */

==Background==
Crystalline, polycrystalline and amorphous materials.

The crystal lattice: unit cell and point lattices. The seven crystal systems. Space groups. Miller indices and Unit vectors. Reciprocal space.

==Short facts==

*Elastic scattering (no energy loss).
*The wavelength of the radiation should be comparable to the interatomic spacing of the material.

==Bragg's law==
*Condition: The planes of atoms responsible for a diffraction peak have to behave as a specula mirror, so that the angle of incidence <math>\theta</math> equals the angle of reflection.
*Bragg's law
:<math> n\lambda=2dsin\theta </math>
where n is an integer, <math>\lambda</math> is the wavelength of the radiation, d is the spacing of the crystal lattice planes and <math>\theta</math> is is the reflection angle.

*Allowed and forbidden reflections
In the FCC (face-centered cubic) lattice the Miller indices have to be all odd or all even.

In the BCC (body-centeres cubic) lattice the sum of h+k+l must be odd for an allowed reflection.

==Reciprocal space==
Bragg's law imposes that the angles of diffraction are inversely proportional to the spacing of the lattice planes. It is therefore helpful to introduce a coordinate system where the axes have the dimensions of inverse length (nm^-1). This system of coordinates is referred to as the reciprocal space.
*The limiting sphere and the Ewald's sphere:
The values of sin<math>\theta</math> will lie between -1 and 1 and therfore 1/d has to lie between 0 and <math>2/\lambda</math> for a diffraction pattern to be generated. (Bragg's law has to be fulfilled). A sphere of radius 2/<math>\lambda</math> is then drawn, where the diffraction crystal is located at the center of the sphere. This sphere, containing all the possible values of 1/d for a given <math>\lambda</math> is called the limiting sphere.

The Ewald's sphere: A smaller sphere of radius 1/<math>\lambda</math> (1/2 of the limiting sphere), that lies in the limiting spere, which is placed so that it just touches the limiting sphere and also the the position of the crystal (the center). This is the Ewals's sphere, or reflecting sphere.
*The reciprocal lattice

==X-ray diffraction==
The X-ray diffractometer is composed of: a X-ray generator, a diffractometer assembly (controls the alignment of the beam as well as the position and orientation of the specimen and the X-ray detector), a detector assembly, X-ray data collection and processing systems.
*Generation of X-rays: X-rays are generated by acceleration of electrons on a pure metal target in ultra-high vacuum. Så må jeg si jeg ikke helt skjønner hva som skjer: hvilke elektroner dytter vekk hvilke? ++
*Characteristic radiation
*Powder diffraction: Polycrystalline samples. The individual grains (single crystals) are randomly orientated in all directions)

[[Kategori: Teknikker i tools]]

Diffraction

2009-05-24T13:49:27Z

Elisaari:

==Background==
Crystalline, polycrystalline and amorphous materials.

The crystal lattice: unit cell and point lattices. The seven crystal systems. Space groups. Miller indices and Unit vectors. Reciprocal space.

==Short facts==

*Elastic scattering (no energy loss).
*The wavelength of the radiation should be comparable to the interatomic spacing of the material.

==Bragg's law==
*Condition: The planes of atoms responsible for a diffraction peak have to behave as a specula mirror, so that the angle of incidence <math>\theta</math> equals the angle of reflection.
*Bragg's law
:<math> n\lambda=2dsin\theta </math>
where n is an integer, <math>\lambda</math> is the wavelength of the radiation, d is the spacing of the crystal lattice planes and <math>\theta</math> is is the reflection angle.

*Allowed and forbidden reflections
In the FCC (face-centered cubic) lattice the Miller indices have to be all odd or all even.

In the BCC (body-centeres cubic) lattice the sum of h+k+l must be odd for an allowed reflection.

==Reciprocal space==
Bragg's law imposes that the angles of diffraction are inversely proportional to the spacing of the lattice planes. It is therefore helpful to introduce a coordinate system where the axes have the dimensions of inverse length (nm^-1). This system of coordinates is referred to as the reciprocal space.
*The limiting sphere and the Ewald's sphere:
The values of sin<math>\theta</math> will lie between -1 and 1 and therfore 1/d has to lie between 0 and <math>2/\lambda</math> for a diffraction pattern to be generated. (Bragg's law has to be fulfilled). A sphere of radius 2/<math>\lambda</math> is then drawn, where the diffraction crystal is located at the center of the sphere. This sphere, containing all the possible values of 1/d for a given <math>\lambda</math> is called the limiting sphere.

The Ewald's sphere:
*The reciprocal lattice

==X-ray diffraction==
The X-ray diffractometer is composed of: a X-ray generator, a diffractometer assembly (controls the alignment of the beam as well as the position and orientation of the specimen and the X-ray detector), a detector assembly, X-ray data collection and processing systems.
*Generation of X-rays: X-rays are generated by acceleration of electrons on a pure metal target in ultra-high vacuum. Så må jeg si jeg ikke helt skjønner hva som skjer: hvilke elektroner dytter vekk hvilke? ++
*Characteristic radiation
*Powder diffraction: Polycrystalline samples. The individual grains (single crystals) are randomly orientated in all directions)

[[Kategori: Teknikker i tools]]

Diffraction

2009-05-24T12:04:03Z

Elisaari: /* Bragg's law */

Diffraction

2009-05-24T12:03:49Z

Elisaari: /* Bragg's law */

Diffraction

2009-05-24T12:03:14Z

Elisaari: /* Bragg's law */

Diffraction

2009-05-24T12:02:13Z

Elisaari: /* Reciprocal space */

Diffraction

2009-05-24T12:01:23Z

Elisaari: /* Reciprocal space */

Diffraction

2009-05-24T12:00:54Z

Elisaari: /* Reciprocal space */

Diffraction

2009-05-24T12:00:24Z

Elisaari: /* Reciprocal space */

Diffraction

2009-05-24T11:58:02Z

Elisaari: /* Reciprocal space */

Diffraction

2009-05-24T11:51:44Z

Elisaari: /* Reciprocal space */

Diffraction

2009-05-24T11:51:15Z

Elisaari:

Diffraction

2009-05-24T11:50:42Z

Elisaari:

Diffraction

2009-05-24T11:49:49Z

Elisaari: /* Bragg's law */

Diffraction

2009-05-24T11:38:12Z

Elisaari: /* Bragg's law */

Diffraction

2009-05-24T11:38:00Z

Elisaari: /* Bragg's law */

Diffraction

2009-05-24T11:37:34Z

Elisaari:

Diffraction

2009-05-24T11:29:45Z

Elisaari:

Diffraction

2009-05-24T10:13:31Z

Elisaari:

Diffraction

2009-05-24T10:07:28Z

Elisaari: Ny side: ==Diffraction== ==Background== Crystalline, polycrystalline and amorphous materials. The crystal lattice: unit cell and point lattices. The seven crystal systems. Space groups. Miller ind...

==Diffraction==

==Background==
Crystalline, polycrystalline and amorphous materials.

The crystal lattice: unit cell and point lattices. The seven crystal systems. Space groups. Miller indices and Unit vectors. Reciprocal space.

TFY4330 - Nanoverktøy

2009-05-24T10:02:19Z

Elisaari: /* Teknikker i tools */

{{Infobox
|Fakta vår 2009
|*Foreleser: Antonius T. J. van Helvoort (Ton van Helvoort)
*Stud-ass: Vidar Tonaas Fauske
*Vurderingsform: Skriftlig eksamen(50%), arbeider(50%)
*Eksamensdato: 28. mai
}}

{{Infobox
|Øvingsopplegg vår 2009
|* Frivillige øvinger torsdager fra 14 til 16, i bestemte uker
}}

{{Infobox
|Lab vår 2009
|* Info om lab
}}

== Faginformasjon ==
Innføring i teori for materialer i forskjellige faser, krystallografi og "probe-matter"-interaksjon.
Innføring i eksperimentelle metoder:
Diffraksjonsteknikker: XRD og elektrondiffraksjon.
Spektroskopi: EDS, EELS, XPS, optisk spektroskopi, Auger.
Mikroskopi: lysmikroskopi, TEM, SEM, SPM, SNOM.
Manipulering: STM/AFM, optiske pinsetter, FIB, etc

== Øvingsopplegg ==
Det er ikke obligatoriske regneøvinger i faget, men enkle laboratorieøvinger og større labrapporter. Våren 2008 skulle det leveres [[Rapport|rapporter]] etter Optics 1 og Optics 2 lab, og tilslutt en case study, som er en samlerapport av alle de tidligere labøktene. Den foreløpige øvingsplanen er som følger:

{| frame=box rules="all"
!WEEK !! TOPIC
|-
| 7 || Crystallography
|-
| 9(Tuesday) || Scattering, structure factors and XRD
|-
| 10 || Electron microscopy I
|-
| 12 || Electron microscopy II (electron diffraction)
|-
| 13 || Miscellaneous I
|-
| 14 || Spectroscopy
|-
| 17 || Miscellaneous II
|-
| 18 || Miscellaneous III (exam08)
|}

== Teknikker i tools ==
Listen er ikke utfyllende

*[[Diffraction]]
*[[SPM]] - Scanning Probe Microscopy
*[[BF]] - Bright Field
*[[DF]] - Dark Field
*[[PC]] - Phase Contrast
*[[AFM]] - Atomic Force Microscopy
*[[STM]] - Scanning Tunneling Microscopy
*[[XRD]] - X-Ray Diffraction
*[[EDS]] - Energy Dispersive Spectroscopy
*[[EELS]] - Electron Energy-Loss Spectroscopy
*[[XPS]] - X-ray Photon Spectroscopy
*[[TEM]] - Transmission Electron Microscopy
*[[HRTEM]] - High Resolution Transmission Electron Microscopy
*[[SEM]] - Scanning Electron Microscopy
*[[FIB]] - Focused Ion Beam
*[[HAADF]] - High Angle Annular Dark Field
*[[EFTEM]] - Energy Filtered TEM
*[[STEM]] - Scanning TEM

[[Kategori: Teknikker i tools]]

== Eksterne linker ==

*[http://www.ntnu.no/studier/emner?emnekode=TFY4330 NTNUs fagbeskrivelse]
*[http://www.ntnu.no/studieinformasjon/timeplan/v09/?emnekode=TFY4330-1 Timeplan Vår09]

[[Kategori:Obligatoriske emner]]
[[Kategori:Fag 4. semester]]
[[Kategori:Fag]]

TFY4330 - Nanoverktøy

2009-05-24T09:53:47Z

Elisaari: /* Liste over forkortelser i Nanoverktøy */

{{Infobox
|Fakta vår 2009
|*Foreleser: Antonius T. J. van Helvoort (Ton van Helvoort)
*Stud-ass: Vidar Tonaas Fauske
*Vurderingsform: Skriftlig eksamen(50%), arbeider(50%)
*Eksamensdato: 28. mai
}}

{{Infobox
|Øvingsopplegg vår 2009
|* Frivillige øvinger torsdager fra 14 til 16, i bestemte uker
}}

{{Infobox
|Lab vår 2009
|* Info om lab
}}

== Faginformasjon ==
Innføring i teori for materialer i forskjellige faser, krystallografi og "probe-matter"-interaksjon.
Innføring i eksperimentelle metoder:
Diffraksjonsteknikker: XRD og elektrondiffraksjon.
Spektroskopi: EDS, EELS, XPS, optisk spektroskopi, Auger.
Mikroskopi: lysmikroskopi, TEM, SEM, SPM, SNOM.
Manipulering: STM/AFM, optiske pinsetter, FIB, etc

== Øvingsopplegg ==
Det er ikke obligatoriske regneøvinger i faget, men enkle laboratorieøvinger og større labrapporter. Våren 2008 skulle det leveres [[Rapport|rapporter]] etter Optics 1 og Optics 2 lab, og tilslutt en case study, som er en samlerapport av alle de tidligere labøktene. Den foreløpige øvingsplanen er som følger:

{| frame=box rules="all"
!WEEK !! TOPIC
|-
| 7 || Crystallography
|-
| 9(Tuesday) || Scattering, structure factors and XRD
|-
| 10 || Electron microscopy I
|-
| 12 || Electron microscopy II (electron diffraction)
|-
| 13 || Miscellaneous I
|-
| 14 || Spectroscopy
|-
| 17 || Miscellaneous II
|-
| 18 || Miscellaneous III (exam08)
|}

== Teknikker i tools ==
Listen er ikke utfyllende

*[[SPM]] - Scanning Probe Microscopy
*[[BF]] - Bright Field
*[[DF]] - Dark Field
*[[PC]] - Phase Contrast
*[[AFM]] - Atomic Force Microscopy
*[[STM]] - Scanning Tunneling Microscopy
*[[XRD]] - X-Ray Diffraction
*[[EDS]] - Energy Dispersive Spectroscopy
*[[EELS]] - Electron Energy-Loss Spectroscopy
*[[XPS]] - X-ray Photon Spectroscopy
*[[TEM]] - Transmission Electron Microscopy
*[[HRTEM]] - High Resolution Transmission Electron Microscopy
*[[SEM]] - Scanning Electron Microscopy
*[[FIB]] - Focused Ion Beam
*[[HAADF]] - High Angle Annular Dark Field
*[[EFTEM]] - Energy Filtered TEM
*[[STEM]] - Scanning TEM

[[Kategori: Teknikker i tools]]

== Eksterne linker ==

*[http://www.ntnu.no/studier/emner?emnekode=TFY4330 NTNUs fagbeskrivelse]
*[http://www.ntnu.no/studieinformasjon/timeplan/v09/?emnekode=TFY4330-1 Timeplan Vår09]

[[Kategori:Obligatoriske emner]]
[[Kategori:Fag 4. semester]]
[[Kategori:Fag]]

Scanning Tunneling Microscopy

2009-05-24T09:52:32Z

Elisaari: /* Principle */

==Fun facts==
*High vacuum is not necessary, but often used.
*Performed on conducting and semi-conducting materials.

==Principle==
A voltage is applied on the probe tip and it is brought close to the surface of the sample. The probe measures the tunneling current that passes from the sample to the tip. How can there be a tuneling current? In classical physics, if a particle would encounter an energy barrier higher than its own energy, it would bounce back. But tunneling is a quantum effect. When an electron meets an energy barrier higher than its own energy it will penetrate the energy barrier, and if the barrier is thin enough (which in this case means a small distance between the probe and the suface) it will have a chance to go through the barrier. This probability of tunneling decreases exponentially with the distance from the tip of the probe to the surface. The tunneling current is also dependent on the density of states of the molecules on the surface of the sample.

The tunneling current is therefore dependent on the density of states at the sample surface and exponentially dependent of the distance.

[[Kategori: Teknikker i tools]]

Scanning Tunneling Microscopy

2009-05-24T09:52:22Z

Elisaari:

Atomic Force Microscopy

2009-05-24T09:51:47Z

Elisaari:

===Fun facts===
*High vacuum is not necessary.
*Piezoelectric position control system.
*The cantilever: V-shaped or single beam. V-shaped: high deflection sensitivity, not sensitive to torque. Single beam: vice-versa.
*Material used: diamond, tungsten, silicon.
*Artifacts: drift, non-linear hysteresis of piezoelectric.

===Modes of operation===
It is the displacement of the probe tip at the end of the cantilever that is measured. The modes have different resolution (can someone explain this?). Problem and material determines which mode is used.

Interaction model lies behind different modes:
* Strong long-range forces: Coulomb forces
* Shorter distances: Van der Waals (kålloidal kemmistri!) These forces decay rapidly, with <math>f \propto d^{-7}</math>
* Strong short range forces: Overlapping of electron shells.

==Contact mode==
In the contact region of the potential energy curve, repulsive forces dominate. This mode has the highest resolution.

Two sub-modes:
*Set height constant and measure repulsive force.
*Set repulsive force constant and measure height.

==Tapping mode==
In the semi-contact region of the potential energy curve. Attractive and repulsive forces have similar magnitude.

==Non-contact mode==
In the non-contact region of the potential energy curve, attractive forces dominate and are measured. What is observed is a an increase in the amplitude of the oscillations of the vibrating probe, translated into a change in attractive forces.

[[Kategori: teknikker i tools]]

Kategori:Teknikker i tools

2009-05-24T09:51:00Z

Elisaari: Ny side: Teknikker i tools

Teknikker i tools

Field Ion Microscopy and Atom probe tomography

2009-05-24T09:50:35Z

Elisaari:

==Field-Ion microscopy==
This method is used to view the arrangement of atoms at the surface of a sharp metal tip. In other words, the specimen is the tip of a needle. The metal tip is brought into a high vacuum chamber, and a high voltage is applied to the tip. The atoms on the surface of the tip become positively charged by ionization and are repelled from the tip. They direction of repel is perpendicular to the surface, and the curved surface causes the magnification. A detector collects the ions and the image formed by these ions can be enough to achieve atomic resolution of the surface.

==Time-of-flight mass spectrometry==

==Atom Probe Tomography==

[[Kategori: teknikker i tools]]

Surface Probe Microscopy

2009-05-24T09:50:05Z

Elisaari: /* Lenker */

Scaning probe microscopy is a field where microstructural information can be obtained by bringing a sharp, needle-shaped solid probe into close proximity to the surface we want to study. This method can give information about the surface structure and surface properties.

==Surface forces==
Three regions can be distinguished on the potential energy curve of to solid surfaces brought into contact.
For larger distances, the non-contact mode, where the attractive forces dominate. These are for example caused by the Coulombic electrostatic forces, if the surfaces are of differernt charge.
At distances smaller than the distance at which the potential enrgy is zero, one can define the contact mode. The repulsive forces are dominating and the attractive ones negligible. These are caused by steric hindrance, or the Debye/diffuse double layers for example.
In between these two regions there is the semi-contact region.

==Resolution==
The probe tip radius limits the resolution of the image and it will be at least one order of magnitude bigger than the atom spacings.
But it can still give atomic resolution.

== Lenker ==
#[[AFM]]
#[[STM]]
#[[Field Ion Microscopy and Atom probe tomography]]

[[Kategori: Teknikker i tools]]

Field Ion Microscopy and Atom probe tomography

2009-05-24T09:48:00Z

Elisaari: Ny side: ==Field-Ion microscopy== This method is used to view the arrangement of atoms at the surface of a sharp metal tip. In other words, the specimen is the tip of a needle. The metal tip is brou...

Surface Probe Microscopy

2009-05-24T09:39:57Z

Elisaari: /* Lenker */

Surface Probe Microscopy

2009-05-24T09:37:27Z

Elisaari: /* Lenker */

Atomic Force Microscopy

2009-05-24T09:25:18Z

Elisaari: /* Contact mode */

===Fun facts===
*High vacuum is not necessary.
*Piezoelectric position control system.
*The cantilever: V-shaped or single beam. V-shaped: high deflection sensitivity, not sensitive to torque. Single beam: vice-versa.
*Material used: diamond, tungsten, silicon.
*Artifacts: drift, non-linear hysteresis of piezoelectric.

===Modes of operation===
It is the displacement of the probe tip at the end of the cantilever that is measured. The modes have different resolution (can someone explain this?). Problem and material determines which mode is used.

Interaction model lies behind different modes:
* Strong long-range forces: Coulomb forces
* Shorter distances: Van der Waals (kålloidal kemmistri!) These forces decay rapidly, with <math>f \propto d^{-7}</math>
* Strong short range forces: Overlapping of electron shells.

==Contact mode==
In the contact region of the potential energy curve, repulsive forces dominate. This mode has the best resolution.

Two sub-modes:
*Set height constant and measure repulsive force.
*Set repulsive force constant and measure height.

==Tapping mode==
In the semi-contact region of the potential energy curve. Attractive and repulsive forces have similar magnitude.

==Non-contact mode==
In the non-contact region of the potential energy curve, attractive forces dominate and are measured. What is observed is a an increase in the amplitude of the oscillations of the vibrating probe, translated into a change in attractive forces.

Scanning Tunneling Microscopy

2009-05-24T09:19:29Z

Elisaari: /* Principe */

Scanning Tunneling Microscopy

2009-05-24T09:17:14Z

Elisaari: /* Principe */

==Fun facts==
*High vacuum is not necessary, but often used.
*Performed on conducting and semi-conducting materials.

==Principe==
A voltage is applied on the probe tip and it is brought close to the surface of the sample. The probe measures the tunneling current that passes from the sample to the tip. How can there be a tuneling current? In classical physics, if a particle would encounter an energy barrier higher than its own energy, it would bounce back. But tunneling is a quantum effect. When an electron meets an energy barrier higher than its own energy it will penetrate the energy barrier, and if the barrier is thin enough (which in this case means a small distance between the probe and the suface) it will have a chance to go through the barrier. This probability of tunneling decreases exponentially with the distance from the tip of the probe to the surface. The tunneling current is also dependent on the density of states of the molecules on the surface of the sample.

:<math>
I U\eta(E,r)exp

</math>

Scanning Tunneling Microscopy

2009-05-24T08:23:26Z

Elisaari: /* Principe */

==Fun facts==
*High vacuum is necessary.
*Performed on conducting and semi-conducting materials.
==Principe==
A voltage is applied on the probe tip and it is brought close to the surface of the sample. The probe measures the tunneling current that passes from the sample to the tip. How can there be a tuneling current? In classical physics, if a particle would encounter an energy barrier higher than its own energy, it would bounce back. But tunneling is a quantum effect. When an electron meets an energy barrier higher than its own energy it will penetrate the energy barrier, and if the barrier is thin enough (which in this case means a small distance between the probe and the suface) it will have a chance to go through the barrier. This probability of tunneling decreases exponentially with the distance from the tip of the probe to the surface. The tunneling current is also dependent on the density of states of the molecules on the surface of the sample.

Scanning Tunneling Microscopy

2009-05-24T08:21:10Z

Elisaari:

==Fun facts==
*High vacuum is necessary.
*Performed on conducting and semi-conducting materials.
==Principe==
A voltage is applied on the probe tip and it is brought close to the surface of the sample. The probe will measure the tunneling current that will pass from the sample to the tip. How can there be a tuneling current? In classical physics, if a paticle would encounter an energy barrier higher than its own energy, it would bounce back. But tunneling is a quantum effect. When an electron meets an energy barrier higher than its own energy it will penetrate the energy barrier, and if the barrier is thin enough (which in this case means a small distance between the probe and the suface) it will have a chance to go through the barrier. This probability of tunneling decreases exponentially with the distance from the tip of the probe to the surface. The tunneling current is also dependent on the density of states of the molecules on the surface of the sample.

Scanning Tunneling Microscopy

2009-05-24T08:07:20Z

Elisaari:

==Fun facts==
*High vacuum is necessary.
*Can only be performed on conducting and semi-conducting materials.

Scanning Tunneling Microscopy

2009-05-24T08:05:29Z

Elisaari: Erstatter siden med «Fun facts:»

Fun facts:

TFY4330 - Nanoverktøy

2009-05-24T08:04:11Z

Elisaari: /* Liste over forkortelser i Nanoverktøy */

{{Infobox
|Fakta vår 2009
|*Foreleser: Antonius T. J. van Helvoort (Ton van Helvoort)
*Stud-ass: Vidar Tonaas Fauske
*Vurderingsform: Skriftlig eksamen(50%), arbeider(50%)
*Eksamensdato: 28. mai
}}

{{Infobox
|Øvingsopplegg vår 2009
|* Frivillige øvinger torsdager fra 14 til 16, i bestemte uker
}}

{{Infobox
|Lab vår 2009
|* Info om lab
}}

== Faginformasjon ==
Innføring i teori for materialer i forskjellige faser, krystallografi og "probe-matter"-interaksjon.
Innføring i eksperimentelle metoder:
Diffraksjonsteknikker: XRD og elektrondiffraksjon.
Spektroskopi: EDS, EELS, XPS, optisk spektroskopi, Auger.
Mikroskopi: lysmikroskopi, TEM, SEM, SPM, SNOM.
Manipulering: STM/AFM, optiske pinsetter, FIB, etc

== Øvingsopplegg ==
Det er ikke obligatoriske regneøvinger i faget, men enkle laboratorieøvinger og større labrapporter. Våren 2008 skulle det leveres [[Rapport|rapporter]] etter Optics 1 og Optics 2 lab, og tilslutt en case study, som er en samlerapport av alle de tidligere labøktene. Den foreløpige øvingsplanen er som følger:

{| frame=box rules="all"
!WEEK !! TOPIC
|-
| 7 || Crystallography
|-
| 9(Tuesday) || Scattering, structure factors and XRD
|-
| 10 || Electron microscopy I
|-
| 12 || Electron microscopy II (electron diffraction)
|-
| 13 || Miscellaneous I
|-
| 14 || Spectroscopy
|-
| 17 || Miscellaneous II
|-
| 18 || Miscellaneous III (exam08)
|}

== Liste over forkortelser i Nanoverktøy ==
Listen er ikke utfyllende

*[[SPM]] - Scanning Probe Microscopy
*[[BF]] - Bright Field
*[[DF]] - Dark Field
*[[PC]] - Phase Contrast
*[[AFM]] - Atomic Force Microscopy
*[[STM]] - Scanning Tunneling Microscopy
*[[XRD]] - X-Ray Diffraction
*[[EDS]] - Energy Dispersive Spectroscopy
*[[EELS]] - Electron Energy-Loss Spectroscopy
*[[XPS]] - X-ray Photon Spectroscopy
*[[TEM]] - Transmission Electron Microscopy
*[[HRTEM]] - High Resolution Transmission Electron Microscopy
*[[SEM]] - Scanning Electron Microscopy
*[[FIB]] - Focused Ion Beam
*[[HAADF]] - High Angle Annular Dark Field
*[[EFTEM]] - Energy Filtered TEM
*[[STEM]] - Scanning TEM

== Eksterne linker ==

*[http://www.ntnu.no/studier/emner?emnekode=TFY4330 NTNUs fagbeskrivelse]
*[http://www.ntnu.no/studieinformasjon/timeplan/v09/?emnekode=TFY4330-1 Timeplan Vår09]

[[Kategori:Obligatoriske emner]]
[[Kategori:Fag 4. semester]]
[[Kategori:Fag]]

Atomic Force Microscopy

2009-05-23T17:19:39Z

Elisaari:

===Fun facts===
High vacuum is not necessary.
Piezoelectric position control system.
The cantilever: V-shaped or single beam. V-shaped: high deflection sensitivity, not sensitive to torque. Single beam: vice-versa.
Material used: diamond, tungsten, silicon.
Artifacts: drift, non-linear hysterisis of piezoelectric.

===Modes of operation===
It is the displacement of the probe tip at the end of the cantilever that is measured.

==Contact mode==
In the contact region of the potential energy curve, repulsive forces dominate. Two sub-modes: Set height constant and measure repulsive force or set force constant and measure height.

==Tapping mode==
In the semi-contact region of the potential energy curve.

==Non-contact mode==
In the non-contact region of the potential energy curve, attractive forces dominate and are measured. What is observed is a an increase in the amplitude of the oscillations of the vibrating probe, translated into a change in attractive forces.

Atomic Force Microscopy

2009-05-23T17:18:58Z

Elisaari:

===Fun facts===
High vacuum is not necessary.
Piezoelectric position control system.
The cantilever: V-shaped or single beam. V-shaped: high deflection sensitivity, not sensitive to torque. Single beam: vice-versa.
Material used: diamond, tungsten, silicon.
Artifacts: drift, non-linear hysterisis of piezoelectric.

===Modes of operation===
It is the displacement of the probe tip at the end of the cantilever that is measured.

==Contact mode==
In the contact region of the potential energy curve, repulsive forces dominate. Two ways: Set height constant and measure repulsive force or set force constant and measure height.

==Tapping mode==
In the semi-contact region of the potential energy curve.

==Non-contact mode==
In the non-contact region of the potential energy curve, attractive forces dominate and are measured. What is observed is a an increase in the amplitude of the oscillations of the vibrating probe, translated into a change in attractive forces.

Atomic Force Microscopy

2009-05-23T17:18:36Z

Elisaari:

====Fun facts====
High vacuum is not necessary.
Piezoelectric position control system.
The cantilever: V-shaped or single beam. V-shaped: high deflection sensitivity, not sensitive to torque. Single beam: vice-versa.
Material used: diamond, tungsten, silicon.
Artifacts: drift, non-linear hysterisis of piezoelectric.

====Modes of operation====
It is the displacement of the probe tip at the end of the cantilever that is measured.

==Contact mode==
In the contact region of the potential energy curve, repulsive forces dominate. Two ways: Set height constant and measure repulsive force or set force constant and measure height.

==Tapping mode==
In the semi-contact region of the potential energy curve.

==Non-contact mode==
In the non-contact region of the potential energy curve, attractive forces dominate and are measured. What is observed is a an increase in the amplitude of the oscillations of the vibrating probe, translated into a change in attractive forces.

Atomic Force Microscopy

2009-05-23T17:18:15Z

Elisaari:

===Fun facts===
High vacuum is not necessary.
Piezoelectric position control system.
The cantilever: V-shaped or single beam. V-shaped: high deflection sensitivity, not sensitive to torque. Single beam: vice-versa.
Material used: diamond, tungsten, silicon.
Artifacts: drift, non-linear hysterisis of piezoelectric.

===Modes of operation===
It is the displacement of the probe tip at the end of the cantilever that is measured.

==Contact mode==
In the contact region of the potential energy curve, repulsive forces dominate. Two ways: Set height constant and measure repulsive force or set force constant and measure height.

==Tapping mode==
In the semi-contact region of the potential energy curve.

==Non-contact mode==
In the non-contact region of the potential energy curve, attractive forces dominate and are measured. What is observed is a an increase in the amplitude of the oscillations of the vibrating probe, translated into a change in attractive forces.